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Low-temperature electrical characterization of the Ti–Si(100) interface at the p-Si/SiGe/Si–Ti structure using Hall measurement analysis
Arashti,
Maryam Gholizadeh.
Physica Scripta.
v.
Volume 88.
no.
Number 2.
2013.
p.
55 -
issn:
0031-8949
.
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