The University of Warwick Library - WebBridge

Calibration of thickness-dependent k-factors for germanium X-ray lines to improve energy-dispersive X-ray spectroscopy of SiGe layers in analytical transmission electron microscopy
Qiu, Yi.  Journal of Physics: Conference Series.  v. Volume 471.   2013. p. 96 - issn: 1742-6596 .   

Online access not found

Sorry - based on the information provided, WebBridge cannot offer appropriate links.