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Ultra low energy O2+SIMS depth profiling of superficial poly(CuPc) and Co(II)T(o-NH2)PP monomolecular layers
Dowsett, M. G..  Surface and Interface Analysis.  v. Volume 45. no. Number 1.   2013-01. p. 324 - 328... issn: 0142-2421 .   

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