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O2+ probe-sample conditions for ultra low energy SIMS depth profiling of nanometre scale Si0.4Ge0.6/Ge quantum wells
Morris,
R. J. H. (Richard J. H.).
Surface and Interface Analysis.
v.
Volume 45.
no.
Number 1.
2013-01.
p.
348 -
351...
issn:
0142-2421
.
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