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Ion, sputter and useful ion yields for accurate quantification of Si1−xGex(0 < x < 1) using ultra low energy O2+ SIMS
Morris, R. J. H. (Richard J. H.).  Surface and Interface Analysis.  v. Vol.43. no. No.1-2.   2011-01. p. 543 - 546... issn: 0142-2421 .   

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