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Thermal stability of thin compressively strained Ge surface channels grown on relaxed Si0.2Ge0.8 reverse-graded buffers
Dobbie,
A. (Andrew).
Journal of The Electrochemical Society.
v.
Vol.159.
no.
No.5.
2012.
p.
H490 -
H496...
issn:
0013-4651
.
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