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Structural characterization of SiO2 and Al2O3 zener-pinned nanocrystalline TiO2 by NMR, XRD and electron microscopy
O'Dell, Luke A..  Journal of Physical Chemistry C.  v. Vol.111. no. No.37.   2007-09-20. p. 13740 - 13746... issn: 1932-7447 .   

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