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Reliability of repetitively avalanched wire-bonded low-voltage discrete power trench n-MOSFETs
Alatise,
Olayiwola M..
IEEE Transactions on Device and Materials Reliability.
v.
Vol.11.
no.
No.1.
2011-03.
p.
157 -
163...
issn:
1530-4388
.
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