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Application of high-resolution X-ray diffraction to study strain status in Si1-xGex/Si1-yGey/Si (001) heterostructures
9th International Conference on Defects: Recognition, Imaging and Physics in Semiconductors (DRIP IX).  v. 91. no. Sp. Iss. SI.   2002-04-30. p. 453 - 456... issn: 0921-5107 .   

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