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Characterisation of IC packaging interfaces and loading effects
Yeo,
H. C..
17th European Symposium on the Reliability of Electron Devices, Failure Physics and Analysis.
v.
46.
no.
9-11 Sp. Iss. SI.
2006-09.
p.
1892 -
1897...
issn:
0026-2714
.
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