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Ultra low energy SIMS, XTEM and X-ray diffraction methods for the characterization of a MBE grown short period (SinGem)(16) superlattices
3rd International Conference on Molecular Beam Epitaxy-Growth Physics and Technology (MBE-GPT 99).
v.
367.
no.
1-2.
2000-05-15.
p.
176 -
179...
issn:
0040-6090
.
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