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Compact electrothermal reliability modeling and experimental characterization of bipolar latchup in SiC and CoolMOS power MOSFETs
Bonyadi,
Roozbeh.
IEEE Transactions on Power Electronics.
v.
30.
no.
12.
2015-12.
p.
6978 -
6992...
issn:
0885-8993
.
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