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THE EFFECT OF INTERFACE ROUGHNESS SCATTERING AND BACKGROUND IMPURITY SCATTERING ON THE THERMOPOWER OF A 2DEG IN A SI MOSFET
JOURNAL OF PHYSICS-CONDENSED MATTER.
v.
2.
no.
51.
1990-12-31.
p.
10401 -
10410...
issn:
0953-8984
.
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