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RIPPLED SURFACE-TOPOGRAPHY OBSERVED ON SILICON MOLECULAR-BEAM EPITAXIAL AND VAPOR-PHASE EPITAXIAL LAYERS
3RD INTERNATIONAL SYMP OF THE 1989 CONF OF THE EUROPEAN MATERIALS RESEARCH SOC : SILICON MOLECULAR BEAM EPITAXY.
v.
183.
1989-12-30.
p.
255 -
262...
issn:
0040-6090
.
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