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A NEW DIAGNOSTIC-TOOL FOR THE NONDESTRUCTIVE CHARACTERIZATION OF DAMAGE ACCOMPANYING THE ELECTROMAGNETIC BREAKDOWN OF EPITAXIAL SILICON P-N-JUNCTIONS
MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY.
v.
15.
no.
1.
1992-10-15.
p.
56 -
62...
issn:
0921-5107
.
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