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High depth resolution Rutherford backscattering analysis of Si-Si0.78Ge0.22/(0 0 1)Si superlattices
5th European Conference on Accelerators in Applied Research and Technology (ECAART5).
v.
139.
no.
1-4.
1998-04.
p.
239 -
243...
issn:
0168-583X
.
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