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High depth resolution Rutherford backscattering analysis of Si-Si0.78Ge0.22/(0 0 1)Si superlattices
5th European Conference on Accelerators in Applied Research and Technology (ECAART5).  v. 139. no. 1-4.   1998-04. p. 239 - 243... issn: 0168-583X .   

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