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In situ high temperature x-ray diffraction measurements on a (TiO2)(0.18)(SiO2)(0.82) xerogel using a curved image-plate
JOURNAL OF PHYSICS-CONDENSED MATTER.  v. 12. no. 15.   2000-04-17. p. 3521 - 3529... issn: 0953-8984 .   

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